Test Engineering

Test engineering is one of the final critical steps before your device is ramped into production. eSilicon’s in-house engineering team moves your product from design to production efficiently. Our team will manage your device through the final stage before volume production using a broad range of expertise in all facets of ASIC device testing. Using our proven flow, our goal is to get your product ramping to production as quickly as possible using our advanced methodologies, processes, and years of experience to choose the right path for your ASIC design.

In-House ASIC Production Test Engineering Expertise

We have in-house expertise in:

  • Test plan development
  • Design-for-test (DFT) methodologies
  • Test pattern conversion
  • Test hardware development
  • Test program development for digital, high-speed interfaces and mixed-signal devices
  • A broad range of tester platforms

Production Device Tests

Our engineers are experienced in the full range of device tests, including:

  • Scan testing using the following fault models:
    • Stuck-at scan
    • Transition scan
    • Path-delay scan
  • Memory built-in self test (MBIST), including:
    • At-speed testing and repair
  • High-speed interfaces, including:
    • DDR1 through DDR4
    • Ethernet
    • LVDS
    • MIPI
    • SerDes (PCIe and XAUI)
    • USB 3.0
  • Phase-locked loops (PLLs) and delay-locked loops (DLLs)
  • USB 1.0 and 2.0
  • Digital-to-analog converters (DAC)
  • Analog-to-digital converters (ADC)

Production Test Platforms

We have completed development for hundreds of devices on many different test platforms, such as:

  • Teradyne
    • J750
    • Catalyst
    • Flex and Ultraflex
  • Verigy
    • 93K — C400/P600/P1000
    • PinScale — PS400/PS800/PS3600
    • SmartScale — PS1600
  • Credence Quartet

eSilicon pre-production ASIC test processes allow for timely bring-up of test programs, device debug, characterization, and release to production.